The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1997
Filed:
Aug. 30, 1995
Applicant:
Inventors:
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395 62 ; 395 65 ; 395608 ; 395614 ;
Abstract
A method-to-derive-attribute-value is set of a procedure inherent to an attribute for deriving an attribute value at each attribute defined in each class in knowledge base. A data-for-value-derivation referred by the set method-to-derive-attribute-value is set at each class defined or inherited by the attribute independently from the method-to-derive-attribute-value. The attribute value is derived by referring to the data-for-value-derivation to be input as the specification of the instance by executing the method-to-derive-attribute-value when the instance is prepared as novel or altered, to thereby set the attribute value of each attribute of the instance.