The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1997

Filed:

Oct. 27, 1995
Applicant:
Inventors:

Gerhard Hidding, Heerenveen, NL;

Bertus Karel Edens, Drachten, NL;

Assignee:

Hadewe B.V., Drachten, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
377 24 ;
Abstract

For determining a displacement of an object (41) from sheetlike material along an observing position (11, 12), each time the object (41) has been displaced over a particular distance, a pulse is generated. The passing object (41) is scanned, whereby a plurality of samples are generated between two pulses, independently of the displacement of the object (41), and to these samples moreover sequence information (37) is coupled. The number of samples between two pulses (39) and the number of generated pulses (38) are counted. The sequence information (37, 38) coupled to identified samples and the counted number of samples between two pulses (39) are used to determine the displacement of the object with greater accuracy than would be possible with the displacement-dependent pulses alone, without requiring that to this end interpolation pulses be generated and processed which are to be processed separately.


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