The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1997
Filed:
Aug. 09, 1995
Toshihiko Himeno, Kawasaki, JP;
Naohiro Matsukawa, Kamakura, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A cell characteristic measuring circuit for a nonvolatile memory is provided which, with the use of one circuit can satisfy both the requirements necessary to a characteristic evaluation using a cell array TEG and reliability evaluation using a memory circuit. The measuring circuit comprises a cell array having a matrix array of NAND strings each having a plurality of series-connected cell transistors, a first select gate and a second select gate connected in series. The cell array is divided into a plurality of blocks, a select gate line is connected to the gates of first select gates in each NAND string in the same block, and a word line is connected to the control gates of cell transistors in each row. A first external terminal is connected to a selected bit line, and a second external terminal is connected to each word line in the plurality of blocks.