The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1997
Filed:
Jun. 14, 1995
Valeri Pavlovich Maltsev, Novosibirsk, RU;
Andrei Vitalievich Chernyshev, Novosibirsk, RU;
Erkki SOINI, Kirjala, FI;
Abstract
A method and device for determination of absolute values of the size and the refractive index of individual microparticles. An optical scanning device for measurement of angular scattering pattern from individual microparticles is described. The light scatter is measured in different angles from moving particles inside the scanning optical system and the values and the angular locations of minima and maxima of the scattering pattern are registered. The size and the refractive index of individual microparticles are calculated from the registered minima and maxima using an empirical equation. An empirical equation has been derived from statistical analysis of angular scattering patterns. These patterns have been calculated on the basis of Mie scattering theory.