The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1997

Filed:

Nov. 21, 1995
Applicant:
Inventors:

Hongfeng Yin, Cupertino, CA (US);

Catherine Keely Templin, Los Altos, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356318 ; 2504581 ; 2504591 ; 356410 ;
Abstract

An analytical system for analyzing a fluid sample is disclosed. The analytical system includes a microcolumn for conducting the fluid sample, a light source for delivering light through the microcolumnar wall into the microcolumn near the outlet end of that microcolumn, and an optical fiber aligned with the microcolumn to detect light that radiates from the fluid sample without passing through the microcolumnar wall. The microcolumn has an inlet end and an outlet end. A light-inlet end of the optical fiber is nonfixedly coupled to the outlet end of the microcolumn. As the fluid sample is driven from the inlet end to the outlet end of the microcolumn, a light of a suitable wavelength is directed at the microcolumn near its outlet end to cause light interaction with the fluid sample. As a result, light radiates from the fluid sample. This light is collected by the optical fiber to provide information on the presence or quantity of an analyte in the fluid sample.


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