The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1997

Filed:

Jun. 05, 1996
Applicant:
Inventors:

Norio Ookawa, Kamakura, JP;

Susumu Takahashi, Kamakura, JP;

Masashi Ueno, Amagasaki, JP;

Osamu Kaneta, Amagasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ; G01J / ;
U.S. Cl.
CPC ...
250332 ; 25037008 ; 25037015 ;
Abstract

Circuitry for a bolometer-type image pickup device improves the signal-to-noise ratio and reduces variations of an output offset level due to temperature variations of the device. A clamp voltage is applied to an amplifier 18 via a clamping diode 36 connected thereto. This reduces a difference between an input voltage during an off-state of one of horizontal FET switches 9, 10, and an input voltage during the off-state of both horizontal FET switches 9, 10, thereby improving a signal-to-noise ratio by narrowing a frequency band of an external circuit. Further, a variable load resistor 43 whose resistance varies with temperature similarly to those of bolometers 1-4, a resistance of a pseudo resistor 44 which is substantially equal to a sum of conductive resistances of vertical FET switches 1, 14 and horizontal FET switches 9, 10, and a compensating diode 45 whose forward bias voltage varies with temperature similarly to those of pixel separating diodes 39-42 are connected in series between the horizontal FET switches 9, 10 and a bias current output terminal 12, thereby offsetting variations of an output offset level due to temperature variations.


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