The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 1997

Filed:

Jun. 22, 1994
Applicant:
Inventors:

Hideki Kambara, Hachiouji, JP;

Kazunori Okano, Shiki, JP;

Satoshi Takahashi, Kunitachi, JP;

Keiichi Nagai, Higashiyamato, JP;

Kazuko Kawamoto, Kokubunji, JP;

Hiroko Furuyama, Kokubunji, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ; C12Q / ; C12P / ; C07H / ;
U.S. Cl.
CPC ...
435-6 ; 435-5 ; 435 911 ; 435 912 ; 536 243 ; 536 2432 ; 536 2433 ; 204456 ; 204461 ;
Abstract

A DNA analyzing method comprising ligating the oligomer of a known base sequence to the DNA fragment obtained by digesting a sample with a restriction enzyme, hybridizing an oligomer and DNA fragment using oligomers which have the sequences of all combinations of the types of the bases within the length of several bases following the known base sequence, checking the presence or absence of hybridization or complementary DNA strand extension, identifying the DNA fragment terminal sequence from this result, and fractionating the DNA fragments and analyzing them. This DNA analyzing method provides an effective analysis of mixtures of long DNAs or DNA fragments.


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