The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 1997
Filed:
Sep. 25, 1995
Klaus Herzog, Aalen, DE;
Werner Lotze, Dresden, DE;
Carl Zeiss-Stiftung, Heidenheim, DE;
Abstract
The invention is directed to a method for calibrating a coordinate measuring apparatus which has a probe 10. The probe 10 is movably guided in a plane (x, y) via two parallel pivot axes (6, 8) which are arranged one behind the other. For calibrating the primary dimensions (R1, R2, .phi.0, .psi.0, dT) of the coordinate measuring apparatus, contours or geometric elements are contact scanned on a calibration body with the probe. The contours or geometric elements are so selected that the diameter dT of the probe ball 12 attached to the probe enters into the measuring result for the geometric elements or their spacing with different weight or sign. Thereafter, the primary dimensions (R1, R2, .phi.0, .psi.0, dT) are determined from the measured values obtained by contact scanning the contours for the position of the probe 10 in the plane (x, y) and from the known dimensions of the geometric elements.