The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 1997
Filed:
Feb. 01, 1996
Chikahiro Deguchi, Yokohama, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A method and apparatus for selecting test patterns of a plurality of groups of test patterns for testing parts of an integrated circuit. The plurality of groups of test patterns are applied to the parts of the integrated circuit to determine which parts are detected by the plurality of groups of test patterns. The detected parts form a group of parts. Each of the groups of test patterns is selectively identified as either necessary or unnecessary by repeatedly referring to the group of parts. Each time a respective group of test patterns is determined to be necessary, the group of parts is reduced by the parts detected by the respective group of test patterns determined to be necessary. After each of the groups of test patterns has been identified as either necessary or unnecessary, the unnecessary groups of test patterns are eliminated, to form a set of remaining necessary groups of test patterns for testing the integrated circuit.