The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 1997
Filed:
Jan. 18, 1995
Bruce S Campbell, Plano, TX (US);
Atlantic Richfield Company, Los Angeles, CA (US);
Abstract
A method and apparatus for adjusting the results of a seismic survey according to well log data obtained from wells within the survey region is disclosed. The disclosed method operates on one seismic horizon at a time, and first applies well log data, arranged by location of the wells in the survey region, to the seismic survey. Deviation values are calculated for each well location, as a signed difference between the actual depth data for the geological interface and a deduced horizon depth from the seismic survey. A difference function is evaluated for each survey point to be adjusted in the survey region (ranging from a single point to all survey points), preferably as a weighted average of the deviations at the wells, where the weighting is inversely related to the distance of the well from the survey point under adjustment. An error value can also be derived, by adjusting the survey region for all wells but one under analysis, deriving an adjusted horizon depth for the well under analysis, and comparing the adjusted horizon depth to the well log interface depth; deriving such error values for all wells in the survey allows a root-mean-square error or other statistic to be generated.