The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1997

Filed:

Jan. 31, 1996
Applicant:
Inventors:

Isao Takikawa, Saitama-ken, JP;

Tadao Kanno, Saitama-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73598 ; 73629 ;
Abstract

The concentration of cavities in a formed product formed by superplastic forming is measured based on a propagation velocity of ultrasonic waves in the formed product. An ultrasonic measuring head which oscillates and receives ultrasonic waves is brought into contact with the formed product. A measurement is made of the propagation time required for the ultrasonic waves to be incident from the ultrasonic measuring head on the formed product to return to the ultrasonic measuring head upon reflection from a rear surface of the formed product. The propagation velocity is obtained from the measured propagation time and the thickness of the formed product.


Find Patent Forward Citations

Takikawa, Isao. (1997). Method of measuring cavities in formed product formed by superplastic (U.S. Patent No. 5648612). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5648612

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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