The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 1997

Filed:

Jan. 19, 1995
Applicant:
Inventors:

Kyriaki Parodos, Marlborough, MA (US);

Janice McCarty, Hyde Park, MA (US);

Assignee:

Amoco Corporation, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H / ;
U.S. Cl.
CPC ...
536 2432 ; 536 2433 ; 935 77 ; 935 78 ;
Abstract

The invention relates to methods of detection of bacteria of the genus Shigella and/or Enteroinvasive E. coli (EIEC) by use of a set of nucleic acid probes. The invention further relates to a set of Shigella specific chromosomal sequences and fragments and to probes derived from the Shigella specific fragments. Additionally, probes were derived from a sequence from the Shigella ompA gene. In particular, a series of probes, each approximately 40 nucleotides in length, were designed having specificity for Shigella or for Shigella and Enteroinvasive E. coli, and having utility in non-isotopic test formats which require amplification to achieve high sensitivity. Specific hybridization probe sets which are capable of detecting substantially all clinically significant serotypes of Shigella, as well as enteroinvasive strains of E. coli, are disclosed.


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