The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 1997
Filed:
Jun. 06, 1995
Applicant:
Inventors:
Assignee:
Siemsns Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
374 57 ; 73643 ;
Abstract
For testing structural ceramic parts under overload conditions, a previously calculated temperature distribution is generated on the part by thermal radiation, this temperature distribution inducing the desired test stress or overload. The temperature distribution is measured with topically and temporally resolving temperature sensors, is compared to a desired or calculated temperature distribution, and is regulated by varying the duration and/or location of the radiation influence until the desired temperature distribution has been produced.