The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 1997

Filed:

Jun. 04, 1996
Applicant:
Inventors:

William C Bruce, Jr, Austin, TX (US);

Wai-On Law, Austin, TX (US);

Elizabeth Marie Rudnick, Urbana, IL (US);

Judith Elizabeth Laurens, Cedar Park, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 27 ;
Abstract

An apparatus and method for generating pseudo-random test instructions for testing a microprocessor begins by providing an array of list structures (502 through 508). Each list structure (502 through 508) contains a list of instructions, a discipline field (34), a pick field (42) and a biasing field (36). A random list of instructions is created by using a list selection discipline field to determine which list (502 through 508) is selected. The discipline field in the particular list (502 through 508) is then used to determine a manner in which instructions are selected from a list of instructions contained within the list structure. The pick field indicates how many instructions are to be selected from each selected list structure using a method determined via the discipline field. Once a number of instructions equal to the pick value has been selected, another list structure is selected as determined in the list selection discipline field until an entire test file of computer instructions is fully generated.


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