The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 1997
Filed:
Aug. 18, 1995
Yoshitake Yanagisawa, Shizuoka, JP;
Sony Disc Technology Inc., Kanagawa, JP;
Abstract
A disc defect inspection apparatus which can detect a defect of a disc, such as an optical disc, with high accuracy. A disc defect inspection apparatus includes a rotating portion for rotating a disc laser radiating optical portion for radiating laser lights on the disc rotated by the rotating portion under predetermined scanning conditions, sensors for detecting reflected laser lights from the disc, and a memory in which output signals of the sensors are stored together with address data generated in unison with the scanning of laser lights. Sensor outputs indicative of address positions of the disc are stored in the memory and sensor outputs near the address positions are read out and a defect of the disc is detected on the basis of a spatial difference among the nearby sensor outputs and the sensor output of the center address position.