The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 1997

Filed:

Mar. 06, 1995
Applicant:
Inventor:

Henry Wei-Ming Chung, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437200 ; 437190 ; 437192 ;
Abstract

A contact to a silicon semiconductor body is fabricated in a manner which merges the benefits of the low contact resistance provided by titanium silicide or cobalt silicide and the good step coverage provided by selective chemical vapor deposition (CVD) of tungsten or molybdenum from tungsten hexafluoride or molybdenum hexafluoride. An intermediate adhesion layer of molybdenum silicide or tungsten silicide is formed by physical vapor deposition, e.g., sputtering or vacuum evaporation, of molybdenum or titanium, followed by annealing. Such adhesion layer protects the underlying layer against damage by fluorine during CVD of the overlying layer of tungsten or molybdenum, as well as providing low resistance and good adhesion to both the underlying and overlying layers.


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