The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1997
Filed:
Jul. 15, 1994
Mario Blaum, San Jose, CA (US);
Alexander Vardy, Champaign, IL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An apparatus and method for detecting and locating up to two symbols in error or erasures in an n.times.m A(n,m,t) parity coded bit array previously recorded on a multi-track storage device where n is a prime number, m.ltoreq.n, wherein at least one non-zero syndrome of m rotated and column summed syndromes is derived. The method includes an iterative process using an incremented tracking variable and testing of the cyclic equivalence of three derived vectors to isolate the number and location of the array column or columns containing the error or errors. Each derived vector is the modulo 2 sum of a selected syndrome and a selected rotated vector. Cyclic equivalence of between a derived vector and a selected rotated one of the other derived vectors for any given iteration establishes the error or errors and their column location or locations. An extension is shown for detecting and locating up to three errors or erasures. Correction of the errors involves parity recoding the array following parity traverses of different slopes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile