The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 1997

Filed:

Dec. 21, 1995
Applicant:
Inventors:

Johannes Van Der Borst, Eindhoven, NL;

Johannes F D'Achard Van Enschut, Eindhoven, NL;

Theodorus J Jenneskens, Eindhoven, NL;

Jacob Dobben, Almelo, NL;

Christiaan J Ter Borch, Almelo, NL;

Hendricus G Van Der Wal, Almelo, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K / ;
U.S. Cl.
CPC ...
378149 ; 378147 ;
Abstract

An X-ray collimator in an X-ray analysis apparatus, consisting of plates of X-ray absorbing material, for example tungsten, which are arranged transversely of the X-ray beam. The plates are identical and provided with a pattern of rows and columns of rectangular openings 40, 42 which have a vertical period p.sub.1 and a horizontal period p.sub.2. The openings take up an opening fraction t.sub.1 and t.sub.2 of the periods p.sub.1 and p.sub.2, respectively. The plates are arranged in the collimator in a series in which the ratio between two successive distances (d.sub.i, d.sub.i+1) between the plates of the series is equal to the given opening fractions t.sub.1 and t.sub.2 of the periods p.sub.1 and p.sub.2, respectively. It has been found that all directions in the X-ray beam are then intercepted except for the direction to be collimated. Moreover, this configuration also enables transverse collimation. The collimator thus formed has a substantially smaller weight and also offers space to accommodate further elements for influencing the X-ray beam.


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