The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1997
Filed:
Jun. 26, 1995
Robert Han Wu, Austin, TX (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
Logic test vectors, used for testing logic circuitry on a logic tester, are converted to test patterns having a format that is used by a memory tester. This allows an integrated circuit having both logic circuitry and a memory array to be tested on a memory tester. A software tool, or computer program, is used to convert the logic test vectors to test patterns, and also generates the memory test code for applying the test patterns to, for example, a logic intensive integrated circuit memory. The software tool is encoded using a high-level programming language and is executed on a computer system (60). The program allows the logic intensive integrated circuit memory to be tested on a memory tester, as compared to testing the integrated circuit memory on a logic tester, significantly reducing testing costs associated with manufacturing.