The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1997
Filed:
Sep. 12, 1995
Jon F Soest, Seattle, WA (US);
James N Horn, Seattle, WA (US);
Thomas E Lock, Woodinville, WA (US);
Gordon L Mitchell, Woodinville, WA (US);
U.S. Natural Resources, Inc., Vancouver, WA (US);
Abstract
A scanning system for wood products to detect grain defects and product geometry simultaneously. Multiple scanner sets cast parallel beams of light at an angle of incidence in a plane that is normal to the surface of the wood product. Scanner sets are provided to scan both the top and bottom surfaces of the wood product. The scanner sets include detector arrays to detect the reflected light of the beams off the surface of the product. One array of each set is positioned strategic to the angle of incidence and another is positioned strategic to the angle of specular reflection. The magnitudes of the detector are compared to determine clear wood or grain defect. The time of detection is used to calculate thickness/geometry.