The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1997
Filed:
Sep. 18, 1995
Nobuo Suzuki, Nukata-gun, JP;
Nidek Co., Ltd., , JP;
Abstract
An ophthalmic apparatus comprising an examining system for examining an eye, wherein the examining system is operated after aligned at a predetermined position with respect to the eye to be examined, comprises the first system for moving the examining system in accordance with operation by an examiner with respect to the eye to be examined, a system for forming alignment indexes on the eye to be examined, a system for detecting the alignment indexes formed on the eye, a system for judging whether or not the alignment indexes detected by the index detecting system are within a predetermined area with respect to the examining system, the second system for further moving the examining system in addition to movement by the first moving system, and a system for controlling, when the judging system judges that the alignment indexes are within a predetermined area, the second moving system to perform alignment based on results from the index detecting system.