The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 1997
Filed:
Nov. 07, 1995
Olaf Dossel, Tangstedt, DE;
Hans-Aloys Wischmann, Hamburg, DE;
Manfred Fuchs, Uetersen, DE;
Rob Steenbrink, Roermond, NL;
Robert Oostenveld, Groningen, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
The invention relates to a method of determining the spatial field distribution and/or the spatial position of a useful field source, producing said field distribution, by means of a multichannel field measuring device which comprises a plurality of spatially distributed sensors which produce measured values which contain on the one hand useful measured values stemming from the useful field source and on the other hand noise measured values stemming from at least one noise field source, correction values being formed and superposed on the measured values so that compensated measured values are obtained which are compared with similarly compensated, mathematically derived reference values which are produced by a fictitious reference field source by means of the field sensors, the reference field source being determined for which the pattern of compensated reference values corresponds best to the pattern of compensated measured values.