The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 1997

Filed:

Feb. 02, 1996
Applicant:
Inventors:

Chang S Hsu, Bridgewater, NJ (US);

Saul C Blum, Edison, NJ (US);

Zhenmin Liang, Branchburg, NJ (US);

Peter B Grosshans, Whitehouse Station, NJ (US);

Winston K Robbins, New Providence, NJ (US);

Assignee:

Exxon Research & Engineering Company, Florham Park, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250282 ; 2504 / ;
Abstract

The present invention is a method to distinguish and measure normal paraffins, isoparaffins, and naphthenes in a saturated hydrocarbon mixture. The method includes the step of field-ionizing hydrocarbon mixture; separating the normal paraffins, isoparaffins and naphthenes as a separate saturates class; and detecting the normal paraffins as molecular ions, naphthenes as molecular ions, and isoparaffins as fragment ions.


Find Patent Forward Citations

Hsu, Chang. (1997). Direct analysis of paraffin and naphthene types in hydrocarbon (U.S. Patent No. 5644129). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5644129

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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