The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1997
Filed:
Jul. 17, 1995
Applicant:
Inventor:
Koichi Shiga, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
395610 ; 395617 ; 395618 ; 39520003 ; 39518309 ; 364D / ; 3642821 ; 3642844 ; 3642854 ;
Abstract
An application testing method is used to test a first application which is written in a language which makes reference to and updates a database. The application testing method includes the steps of (a) giving test data to the first application by a capacity of a second application which issues a request, and (b) invalidating updating of the database made by the first application by a communication process which links to a transaction monitor or a database management system.