The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1997
Filed:
Jul. 31, 1995
Applicant:
Inventors:
Shih-Jong J Lee, Bellevue, WA (US);
Paul S Wilhelm, Kirkland, WA (US);
Assignee:
NeoPath, Inc., Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382199 ; 382274 ;
Abstract
A method for single image based image contrast quality evaluation is used in a computer controlled image system including an automated microscope for acquiring images. An image is acquired. An image contrast score is computed for the image. An image reliability score is computed for the image. The image contrast score and image reliability score are accumulated and combined to produce a contrast quality score. The contrast quality score is compared to a predetermined limit so as to produce a quality of processing result.