The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1997
Filed:
Dec. 12, 1994
O Patrick Brady, Loudonville, NY (US);
Clyde J Hindes, West Sand Lake, NY (US);
Boris I Mintseris, Latham, NY (US);
Alexander S Tseytlin, Farmington Hills, MI (US);
Gurley Precision Instruments, Inc., Troy, NY (US);
Other;
Abstract
A system for measuring the accuracy of a machines and mechanisms having a driving member and a driven member is disclosed. The absolute position of the driving member is determined using a first absolute encoder operatively engaged to the driving member. The actual absolute position of the driven member is also determined using a second absolute encoder operatively engaged to the driven member. The theoretical absolute position of the driven member is then calculated based upon the absolute position of the driving member. The actual absolute position of the driven member is compared to the theoretical absolute position of the driven member, preferably by subtraction, to determine the accuracy of the machines and mechanisms. Optical absolute encoders may be used and the process may be performed using a microprocessor which may utilize a ratio function to calculate the theoretical absolute position of the driven member based upon the absolute position of a driving member. The ratio function may be a mathematical representation of the theoretical position of the driven member based upon the absolute position of the driving member. Using this system, kinematic accuracy or error may be determined in both the static and dynamic modes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile