The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 1997

Filed:

Oct. 24, 1995
Applicant:
Inventors:

Hironori Takahashi, Hamamatsu, JP;

Kazuhiko Wakamori, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 96 ; 324750 ;
Abstract

An electrooptic probe for measuring voltage of an object without contact with the object. The electrooptic probe according to the present invention includes an electro-optic material having a refractive index to light that varies in accordance with an electric field, a conductive reflecting film for reflecting an incident beam transmitted through the electro-optic material, fixed to an end face of the electro-optic material facing the object to be measured, a transparent electrode fixed on the other end face of the electro-optic material, and a high permittivity film fixed on an end face of the reflecting film facing the object to be measured.


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