The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 1997

Filed:

Jun. 12, 1992
Applicant:
Inventor:

Barton E Dahneke, Palmyra, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
738655 ; 73 2801 ; 250287 ; 250288 ; 356336 ; 356337 ;
Abstract

The method of measuring at least two distinct properties of a single particle comprising: a) accelerating a particle having a certain velocity in at least one acceleration region, the acceleration region being a region in which the velocity of the particle changes, to cause the velocity of the particle to vary; b) detecting a passage of the particle at each of three or more locations within or near an acceleration region; c) measuring a set of time-of-flight values for the particle, each time-of-flight value being equal to a time interval between the passage of the particle at two locations; and d) determining the values of at least two properties of the particle by comparing the set of time-of-flight values for the particle with calibration data.


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