The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 1997
Filed:
Nov. 15, 1995
Shin-Gwo Shiue, Hsinchu Hsien, TW;
Tai-San Liao, Taichung, TW;
Sheng-Tsang Chang, Hsinchu, TW;
Ching-Fen Kao, Hsinchu, TW;
National Science Council, Taiwan, TW;
Abstract
An apparatus for measuring the curvature radii of spherical and cylindrical surfaces is provided. The apparatus comprises a base, a probe and four ball rings of the same size, wherein the four ball rings are provided on the base and arranged into a square having a side length C. The probe is upward and downward movably mounted on the top surface of the base at the center of the square. There is also provided a method for measuring the curvature radii of spherical and cylindrical surfaces, wherein a ball-ring-distance is equal to C for the cylindrical surface or is equal to .sqroot.2C for the spherical surface.