The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 1997

Filed:

Oct. 24, 1994
Applicant:
Inventors:

Hirokatsu Fujiwara, Hadano, JP;

Ryo Yamagata, Sagamihara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518306 ;
Abstract

A fault detecting apparatus includes first and second processors having an internal state generating logic unit for exclusive-ORing the operation outputs and generating an internal state signal of the first and second processors, and a state comparator unit included in the first and second processors for comparing the internal state signals of the first and second processors. When the internal state signals fail to coincide with each other, the state comparator unit decides on an error of at least one of the first and second processors.


Find Patent Forward Citations

Fujiwara, Hirokatsu. (1997). Fault detecting apparatus for a microprocessor system (U.S. Patent No. 5640508). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5640508

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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