The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 1997

Filed:

Jun. 16, 1995
Applicant:
Inventors:

Ralf Beier, Hamburg, DE;

Axel Nathe, Hamburg, DE;

Marten Swart, Obertraubling, DE;

Horst Belau, Kelheim-Kopfelberg, DE;

Assignees:

U.S. Philips Corp., New York, NY (US);

Siemens AG, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324522 ; 324713 ; 324537 ;
Abstract

A circuit for testing the leakage resistance of a circuit point. Particularly in the case of circuits where safety is important, a circuit point, particularly an output terminal of an integrated circuit, should be tested for a leakage resistance relative to ground and/or a voltage to provide an early detection of an imminent failure condition. To this end, at least one test current is fed into the circuit point and the voltage at the circuit point is monitored by means of a comparator. When the leakage resistance decreases below a permissible value the voltage at the circuit point decreases, which can be detected by the comparator. For monitoring a leakage resistance relative to both poles two opposite test currents are applied and the comparator is constructed as a window comparator.


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