The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 1997
Filed:
Dec. 07, 1995
Takaki Arai, Saitama-ken, JP;
Osamu Seshimoto, Saitama-ken, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
When spotting a sample liquid onto a plurality of frameless chemical analysis films, a predetermined amount of the sample liquid is sucked into a spotting tip, the lower end of the spotting tip is brought into contact with the surface of each chemical analysis film and the pressure in the spotting tip is increased to discharge the sample liquid therein onto the surface of the chemical analysis film while lifting the spotting tip away from the surface of the film. When a first chemical analysis film includes a component which can deteriorate the accuracy of measurement of the analyte for the second frameless chemical analysis film, the sample liquid is spotted, before the second chemical analysis film after the first chemical analysis film, on a third frameless chemical analysis film which does not include a component which can deteriorate the accuracy of measurement of the analyte of the second chemical analysis film and the analyte of which is not such that the accuracy of its measurement is substantially affected by a component of the first chemical analysis film which can be transferred to the third chemical analysis film.