The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 1997
Filed:
Dec. 29, 1993
Applicant:
Inventors:
Eiji Nishimori, Yokohama, JP;
Toshiaki Shingu, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382141 ;
Abstract
Disclosed is an evaluation method and apparatus used as when inspecting the mounted state of an IC. The evaluation method and apparatus are adapted to acquire the image of an object under inspection, subject the image to two types of image processing based upon two different evaluation methods, and inspect and evaluate the object as regards to the acceptability of soldered state, for example, based upon the results of the two evaluations.