The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 1997
Filed:
Jul. 22, 1994
Friedrich M Forster, Pfullingen, DE;
Institut Dr. Friedrich Forster, Reutingen, DE;
Abstract
A method and apparatus for electro-magnetically testing surface regions of elongated test objects for irregularities, such as flaws, and which is particularly suitable for testing test objects with non-circular or elliptical cross sections. Testing is performed by at least one coil, particularly an eddy current coil, through which a test object passes. The test coil has a coil plane passage of predetermined cross-section, and a modification of the passage cross-section of the test coil can be obtained by tilting the test coil. The test coil can optionally be rotated about an axis defined by the travel direction of the test object, and may also be moved in directions perpendicular to the travel direction. A disclosed apparatus for performing the method has several tiltable and rotatable and/or slidable test coils which are successfully arranged in the travel direction in the form of a coil group.