The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 1997
Filed:
Jul. 08, 1994
Simon A Segars, Cambridge, GB;
Advanced Risc Machines Limited, Cambridge, GB;
Abstract
An integrated circuit test mechanism based upon the JTAG standard utilises serial scan chains for applying signals to and capturing signals from predetermined nodes within an integrated circuit (2). Multiple independent scan chains (12, 14, 16) are provided for different circuit units (4, 6, 8, 10) within the integrated circuit, i.e. individual scan chains (12, 14) for circuit elements such as a central processing core (4) or a cache memory (8). The scan chain controller (18) is responsive to a scan chain selecting instruction (Scan-N) received at its serial input (20) to capture a scan chain specifying value at the serial input. The scan chain specifying value is then used to control the position of a scan chain multiplexer (28) that selects one of the multiple scan chains to which subsequent instructions received at the serial input are applied.