The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 1997

Filed:

Jun. 07, 1995
Applicant:
Inventors:

Seishiro Saikan, Toyonaka, JP;

Kiyoshi Uchikawa, Tokyo, JP;

Hisao Ohsawa, Yachiyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369100 ; 365106 ; 365119 ; 369103 ; 369108 ;
Abstract

The recording method and apparatus according to this invention is an 'optical recording method utilizing a simulated photon echo' in which information is recorded by irradiating data a.d record excitation lights at the same time or at different times on the same location of a recording medium, and in which the delay time of a record excitation light electric field and a data light electric field is recorded as the information by use of a common incoherent light split into two equal parts: the data light and the record excitation light. In the reproducing method and apparatus according to this invention, reproducing excitation and probe lights are illuminated on the recording medium and the stimulated photon echo light emitted from the medium by illumination of the reproducing excitation light overlaps the probe light. The 'stimulated photon echo' reproducing the information is utilized by converting the synthetic light obtained from the overlap into an electrical signal at a photo detector. A common incoherent light is split into two equal parts, the reproducing excitation and the probe lights, whereby the delay time of the reproducing excitation light electric field and the probe light electric field is set to predetermined values, or a first predetermined value is swept to a second predetermined value.


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