The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 1997
Filed:
Jul. 05, 1995
Raoul B Salem, Redwood City, CA (US);
Vernon R Brethour, Owens Cross Road, AL (US);
Wen-Jay Hsu, Fremont, CA (US);
Raymond A Heald, Los Altos, CA (US);
Subramanian Ganesan, San Jose, CA (US);
Sun Microsystems, Inc., Mountain View, CA (US);
Abstract
A method is provided for accurately determining the propagation delay of a gate under consideration in a static timing analyzer. This is accomplished by determining both the output load and input rise time of the gate under consideration. These values are then compared with a load versus rise time grid having previously determined values of propagation delay (points) for specified combinations of load and input rise time. These points are then used to interpolate a value of propagation delay for the gate under consideration by an interpolation technique that accounts for at least one of the following non-linear effects: the feed forward capacitance of a gate, soft switching, gate resistance, source and drain resistance, and/or other non-linear effects. The method accounts for each non-linear effect by imparting a corresponding component to propagation delay only in that range of output load and input rise time for which that non-linear effect is most pronounced.