The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 1997
Filed:
Jul. 21, 1995
Applicant:
Inventors:
Bruce H Zimmerman, Homer, NY (US);
James R Fendley, Arlington Heights, IL (US);
Assignee:
BMC Industries, Inc., Minneapolis, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ; G01B / ; G01B / ;
U.S. Cl.
CPC ...
356384 ; 356385 ; 356386 ; 25055919 ; 25055924 ;
Abstract
A laser probe for measuring apertures in a sheet of material has a laser beam and a detection system. The laser beam has a major axis and a minor axis which are orthogonal to each other. The major axis is much larger than the minor axis. The dimensions of the apertures are determined from the fraction of the laser beam which passes through the sheet of material. Slot widths are measured by identifying relatively constant amounts of light passing through the sheet as the sheet moves relative to the laser beam.