The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 1997
Filed:
Sep. 25, 1995
Other;
Abstract
The invention relates to an apparatus intended especially for making a contactless measurement of the thickness of measurement objects made of transparent material. In the course of this measurement, two opposing beams produced by a first and second radiation source are directed through first and second beam splitters and through a deflecting device consisting of a body of transparent material having reflecting and refracting boundary surfaces. Thereafter, the beams are directed obliquely onto the surface of the object to be measured. The first and second component beams are reflected off the forward and rearward surfaces, respectively, of the object and are directed through first and second beam splitters onto first and second detecting devices. In order to facilitate a compact configuration and higher measurement precision, the first and second beam splitters define the incidence surfaces of the deflecting device facing towards the radiation sources.