The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 1997

Filed:

Feb. 01, 1996
Applicant:
Inventors:

Atsushi Okuyama, Ibaraki-ken, JP;

Takashi Yoshida, Ibaraki-ken, JP;

Fujio Tajima, Tsuchiura, JP;

Masamichi Ito, Ibaraki-ken, JP;

Yasuhiro Mii, Ibaraki-ken, JP;

Masato Soma, Takasaki, JP;

Hidehito Yamada, Takasaki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 4434 ; 369 4435 ; 369106 ; 369124 ;
Abstract

A positioning system of an optical disc apparatus includes focus error detecting part for detecting a focus error signal as a focal shift of a light spot related to an information recording surface of an optical disc, light spot moving part in the direction intersecting substantially perpendicularly to the optical disc surface, first digital arithmetic part for receiving the focus error signal and outputting a first control signal, second digital arithmetic part for receiving the focus error signal and a specified third control signal, performing arithmetic operations of a disturbance observer and outputting a second control signal, adding circuit for adding the first control signal and the second control signal and outputting the third control signal, drive circuit for driving the light spot moving part in a direction intersecting perpendicularly to the disc surface by the third control signal, wherein the first and the second digital arithmetic circuit perform arithmetic operations at different sampling periods.


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