The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 1997
Filed:
Jul. 31, 1995
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
The present invention relates to an ophthalmometric apparatus and is intended to provide an ophthalmometric apparatus that generates image signals representing a section of a measuring portion of a measuring eye. A first light source emits light rays having a comparatively short coherence length, a measuring optical system converges a light beam emitted by the first light source on a position substantially corresponding to the pupil of the measuring eye to illuminate a measuring portion, a beam splitter separates a reference optical path from the measuring optical path of the measuring optical system, a reference optical system including a reflecting mirror reflects a reference light beam, an interference optical system combines a reflected measuring light beam and a reflected reference light beam reflected by the reference optical system for interference, an image pickup device having a plurality of image sensing elements disposed in a substantially conjugate relation with the measuring portion receives an interference light beam provided by the interference optical system, an image signal generating unit generates image signals representing a section of the measuring eye from the output signals of the image pickup device when the reflecting mirror is shifted.