The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 1997

Filed:

Dec. 19, 1995
Applicant:
Inventor:

Glenn S Spitz, Northport, NY (US);

Assignee:

Webscan, Inc., Northport, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
235462 ; 235463 ;
Abstract

A method and apparatus to enable the high speed evaluation of the quality of a bar code indicia by processing a scan reflectance profile signal generated by a scanner unit. The scan reflectance profile signal is sampled by an analog-to-digital converter, with the sample values from the converter processed as they are produced in real-time to determine a highest positive peak sample value and a lowest negative peak sample value for each element of the bar code indicia. The lowest negative and highest positive peak sample values for each element being accessible for post-processing to determine at least one figure of merit indicative of the quality of the bar code indicia being evaluated. The samples produced by the a/d converter are processed as they are generated to filter and reduce the total collection of sample values stored and/or considered, while still providing the critical highest and lowest peak sample values for the scanned elements to enable high speed verification.


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