The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 1997

Filed:

May. 26, 1995
Applicant:
Inventors:

Michael H Azarian, Cupertino, CA (US);

Michael A Baldwinson, Cupertino, CA (US);

David T Gutowski, Santa Cruz, CA (US);

Harold J Hamilton, Santa Clara, CA (US);

James P Hennessy, Campbell, CA (US);

Mark W Parcher, Fremont, CA (US);

Kenneth K Tang, Cupertino, CA (US);

Assignee:

Censtor Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B / ; B24B / ;
U.S. Cl.
CPC ...
451 54 ; 451-8 ; 451 21 ; 2960308 ; 2960312 ; 2960316 ;
Abstract

An interactive system for lapping transducers has an abrasive surface that communicates with the transducers in order to provide information for controlling the lapping and testing the transducers. The lapping body is preferably shaped as a disk, drum or tape, and communicates with the transducer with a type of signal that the transducer is designed to read and/or write. Thus for lapping a magnetic head or slider to be employed in a hard disk drive, the lapping body contains a magnetic medium layer that is either prerecorded or written by the head during lapping, while the signal received by the head is monitored and analyzed by a processor in order to determine, in part, when to terminate lapping. A series of transducers can be simultaneously lapped while individually monitored, so that each transducer can be removed from the lapping body individually upon receipt of a signal indicating that transducer has been lapped an optimal amount. Transducers for employment in drive systems can also be tested for performance characteristics by utilizing lapping bodies having surface characteristics similar to those found in the drive system.


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