The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 1997

Filed:

Oct. 30, 1995
Applicant:
Inventors:

Robert A Cutright, Holland, MI (US);

Richard Walker, Hudsonville, MI (US);

Wayne Walton, Holland, MI (US);

Assignee:

Venturedyne, Ltd., Milwaukee, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
738656 ;
Abstract

A new method provides test equipment having a humidification capability. Such method includes the steps of fabricating equipment having (a) a chamber for stress-testing products placed therein, and (b) a cavity for receiving a module. The equipment is installed in a product test facility and used for stress-testing (by, e.g., 'temperature cycling') a first group of products placed in the chamber. Later (perhaps several months or years later), the module is mounted in the cavity, a second group of products is placed in the chamber and humidity-controlled air is circulated across the second group of products. The new method is particularly useful for manufacturers or testers of products like electronic printed circuit boards initially requiring only a temperature-related testing capability but later needing to add humidity-related testing regimens.


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