The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 1997
Filed:
Jul. 31, 1995
Edward J Nieters, Rexford, NY (US);
Robert S Gilmore, Burnt Hills, NY (US);
Michael F Gigliotti, Jr, Scotia, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A nondestructive evaluation method is described for ultrasonic evaluation and detection of features in polycrystalline materials, such as grain orientation (e.g. texturing) or grain boundary orientation. The method may, for example, be employed to detect diffusion bonds that contain undesirable planar grain boundary arrays. The method utilizes time of flight statistics gathered from reflections associated with incident ultrasonic signals directed into a plurality of locations within the material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile