The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 1997
Filed:
Sep. 24, 1993
Yiu-Wa A Lau, Houston, TX (US);
Exxon Production Research Company, Houston, TX (US);
Abstract
Disclosed is a method of datuming seismic trace data from a first horizon to a lower second subsurface horizon, both located above a target horizon. A seismic source and receiver are positioned along the first horizon and each assigned a coordinate representing a position along the first horizon. The seismic trace data includes both header information and seismic data. The header information includes the coordinates assigned to the source and receiver. The seismic data is a record of reflection amplitude versus travel time of a seismic signal traveling from the source, downward through and intersecting the second horizon at a downward intersection point, reflecting upward from the target horizon, upward through and intersecting the second horizon at an upward intersection point, and upward to the receiver. The method generally includes determining for both the downward upward intersection points, coordinates along the second horizon corresponding to positions along the second horizon. The header information will now include these coordinates along the second horizon. Additionally, disclosed is a method of processing seismic trace data, in which datumed seismic trace data, datumed by any method or as described above, is now processed utilizing surface consistent algorithms to remove the effect of the subsurface between the first and second horizon.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile