The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 1997

Filed:

Jul. 19, 1995
Applicant:
Inventors:

Akihiro Hayashi, Toyokawa, JP;

Yasumi Hikosaka, Gamagori, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351232 ; 351237 ; 351239 ; 351243 ;
Abstract

A visual function examination apparatus, comprising an optotype presenting device for presenting optotypes for use in examinations of visual functions of examinee's eyes, for examining visual functions of the eyes by delivering luminous flux via reflecting system from the optotype presenting device, wherein the optotype presenting device is provided with optotypes for examinations to be carried out as the examinee opens his both eyes, the optotypes having polarizing plates, and a binocular fixation target which should become fusion impulse to binocular vision is disposed around the optotypes for examinations.


Find Patent Forward Citations

Hayashi, Akihiro. (1997). Visual function examination apparatus including binocular fixation target (U.S. Patent No. 5629748). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5629748

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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