The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 1997
Filed:
Jan. 02, 1996
Takaki Arai, Saitama-ken, JP;
Osamu Seshimoto, Saitama-ken, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
A dry chemical analysis film deposited with a sample liquid is inserted into an incubator to be incubated at a predetermined temperature, a coloring reaction of the chemical analysis film is measured after the incubation and then the chemical analysis film is discharged from the incubator. A plurality of chemical analysis films are subjected to these steps one by one after the preceding chemical analysis film is discharged from the incubator. When a first chemical analysis film is for an analyte which generates an interfering gas or the like which can adversely affects the accuracy of measurement of other chemical analysis films and a second chemical analysis film the accuracy of measurement on which can be adversely affected by the interfering gas or the like is to be inserted into the incubator after the first chemical analysis film is discharged, an adsorptive film which adsorbs the interfering gas or the like generated from the first chemical analysis film is inserted into the incubator after discharge of the first chemical analysis film prior to insertion of the second chemical analysis film.