The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 1997

Filed:

Jun. 21, 1996
Applicant:
Inventors:

Robert L Baan, Wallkill, NY (US);

Paul J Damore, Fishkill, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356372 ; 356383 ; 356386 ; 25055924 ; 25055926 ; 2502 / ;
Abstract

A method and apparatus for measuring the x-y-z dimensions of an article such as a ceramic chip carrier are provided. The measuring apparatus and method utilize scanning laser beams to measure the dimensions of the article without physically contacting the article as the article is moved through the measuring device at a controlled speed preferably on a cushion of air. A separate laser beam scanning device is used to measure each dimension of the article and the laser beams are positioned to scan back and forth along the dimension to be measured. As the article moves through the preferred L-shaped apparatus, the direction of the article automatically changes in a transverse direction so that all three dimensions are conveniently and accurately measured.


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