The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 1997

Filed:

Nov. 17, 1995
Applicant:
Inventors:

Georges Couderc, Bures sur Yvette, FR;

Francedilla.ois Micheron, Gif-sur-Yvette, FR;

Assignee:

Thomson-CSF, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
250334 ; 250332 ;
Abstract

It is sought to obtain efficient detection and tracking capacity by a particular form of organization including a micro-scanning device common to all the detectors. In one embodiment, the disclosed device includes of a frame with a shape generated by revolution around an elevation axis. This frame bears afocal optical sets coupled respectively to optical focusing sets to project the light fluxes coming from the scenes observed and to form images on fixed detectors. Prisms, with a predetermined angle at the vertex and a predetermined orientation, are distributed in a circle on a rotational drum with an axis that is identical with the elevation axis so that, during the rotation of the drum, each prism intercepts the observation flux in the form of parallel beams and deflects it so as to prompt a virtual shift of the sensors of each detector corresponding to a micro-scanning step. Such an operation may find particular application to panoramic imaging, in particular to simultaneous observation by several operators.


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